EnviroMETROS FAB

Novel hybride surface metrology for wafer handling systems

EnviroMETROS LAB

Novel hybride surface metrology for laboratory environments

EnviroESCA

Near Ambient Pressure XPS System

NanoESCA MARIS

Advanced momentum and real space microscope with IDEA mode and modular concept.

Mimea BP6 Base Package

The new measurement and control system for SPM

PHOIBOS 225 HV 2D-DLD

Ultimate HAXPES Analyzer with 2D DLD Detector

PHOIBOS 150 HV NAP 2D-CCD/CMOS

Analyzer with 2D-CCD Detector for NAP-HAXPES Applications

PHOIBOS 150 with 2D-CMOS and 3D(2D) Spin Mott Detector

ARPES/Spin Analyzer with 2D-CMOS and 3D Mott Detector

PHOIBOS 150 2D-CMOS/-CCD

The ARPES/XPS Analyzer with CMOS Detector and 150 mm Radius

KREIOS 150 MM

Next Generation Momentum Microscope

ASTRAIOS 190 2D-CMOS

2D momentum mapping electron analyzer for ARPES

X-ray sources Comparison Table

UV sources Comparison Table

Ion/Electron sources Comparison Table

ErLEED 100

Reverse view LEED optics for structural analysis and AES

ErLEED 150

LEED Optics

EBE-4 E-beam Evaporator

Multi-Pocket Electron Beam Evaporator

FE-LEEM/PEEM P90